BibTeX record conf/iscas/TehranipoorKYC17

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@inproceedings{DBLP:conf/iscas/TehranipoorKYC17,
  author    = {Fatemeh Tehranipoor and
               Nima Karimian and
               Wei Yan and
               John A. Chandy},
  title     = {Investigation of {DRAM} PUFs reliability under device accelerated
               aging effects},
  booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2017,
               Baltimore, MD, USA, May 28-31, 2017},
  pages     = {1--4},
  year      = {2017},
  crossref  = {DBLP:conf/iscas/2017},
  url       = {https://doi.org/10.1109/ISCAS.2017.8050629},
  doi       = {10.1109/ISCAS.2017.8050629},
  timestamp = {Tue, 20 Feb 2018 15:05:53 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/iscas/TehranipoorKYC17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iscas/2017,
  title     = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2017,
               Baltimore, MD, USA, May 28-31, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8014728},
  isbn      = {978-1-4673-6853-7},
  timestamp = {Sat, 07 Oct 2017 17:45:24 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iscas/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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