BibTeX record conf/irps/YamaguchiFKKINT18

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@inproceedings{DBLP:conf/irps/YamaguchiFKKINT18,
  author       = {Marina Yamaguchi and
                  Shosuke Fujii and
                  Yuuichi Kamimuta and
                  Shoichi Kabuyanagi and
                  Tsunehiro Ino and
                  Yasushi Nakasaki and
                  Riichiro Takaishi and
                  Reika Ichihara and
                  Masumi Saitoh},
  title        = {Impact of specific failure mechanisms on endurance improvement for
                  HfO2-based ferroelectric tunnel junction memory},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353633},
  doi          = {10.1109/IRPS.2018.8353633},
  timestamp    = {Sun, 02 Oct 2022 16:09:06 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/YamaguchiFKKINT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}