BibTeX record conf/irps/WeckxKCFBCWRCG15

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@inproceedings{DBLP:conf/irps/WeckxKCFBCWRCG15,
  author    = {Pieter Weckx and
               Ben Kaczer and
               C. Chen and
               Jacopo Franco and
               Erik Bury and
               K. Chanda and
               J. Watt and
               Philippe J. Roussel and
               Francky Catthoor and
               Guido Groeseneken},
  title     = {Characterization of time-dependent variability using 32k transistor
               arrays in an advanced {HK/MG} technology},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {3},
  year      = {2015},
  crossref  = {DBLP:conf/irps/2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112702},
  doi       = {10.1109/IRPS.2015.7112702},
  timestamp = {Sun, 21 May 2017 00:17:26 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/WeckxKCFBCWRCG15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2015,
  title     = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7106273},
  isbn      = {978-1-4673-7362-3},
  timestamp = {Mon, 07 Mar 2016 09:32:18 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/irps/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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