BibTeX record conf/irps/WanHYHK19

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@inproceedings{DBLP:conf/irps/WanHYHK19,
  author       = {H. W. Wan and
                  Y. J. Hong and
                  L. B. Young and
                  M. Hong and
                  J. Kwo},
  title        = {Fundamental Understanding of Oxide Defects in HfO2 and {Y2O3} on GaAs(001)
                  with High Thermal Stability},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720415},
  doi          = {10.1109/IRPS.2019.8720415},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WanHYHK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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