BibTeX record conf/irps/VaisMFLARSCTHGD15

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@inproceedings{DBLP:conf/irps/VaisMFLARSCTHGD15,
  author    = {Abhitosh Vais and
               Koen Martens and
               Jacopo Franco and
               D. Lin and
               A. Alian and
               Philippe Roussel and
               S. Sioncke and
               Nadine Collaert and
               Aaron Thean and
               Marc M. Heyns and
               Guido Groeseneken and
               Kristin De Meyer},
  title     = {The relationship between border traps characterized by {AC} admittance
               and {BTI} in {III-V} {MOS} devices},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {5},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112742},
  doi       = {10.1109/IRPS.2015.7112742},
  timestamp = {Sat, 19 Oct 2019 20:31:24 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/VaisMFLARSCTHGD15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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