BibTeX record conf/irps/TorresAHD19

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@inproceedings{DBLP:conf/irps/TorresAHD19,
  author    = {Frank Sill Torres and
               Hussam Amrouch and
               J{\"{o}}rg Henkel and
               Rolf Drechsler},
  title     = {Impact of {NBTI} on Increasing the Susceptibility of FinFET to Radiation},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  pages     = {1--6},
  year      = {2019},
  crossref  = {DBLP:conf/irps/2019},
  url       = {https://doi.org/10.1109/IRPS.2019.8720468},
  doi       = {10.1109/IRPS.2019.8720468},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/TorresAHD19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2019,
  title     = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8712125/proceeding},
  isbn      = {978-1-5386-9504-3},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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