BibTeX record conf/irps/NairBTZCGKC19

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@inproceedings{DBLP:conf/irps/NairBTZCGKC19,
  author    = {Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori and
               Houman Zahedmanesh and
               Kristof Croes and
               Kevin Garello and
               Gouri Sankar Kar and
               Francky Catthoor},
  title     = {Variation-Aware Physics-Based Electromigration Modeling and Experimental
               Calibration for {VLSI} Interconnects},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  pages     = {1--6},
  year      = {2019},
  crossref  = {DBLP:conf/irps/2019},
  url       = {https://doi.org/10.1109/IRPS.2019.8720559},
  doi       = {10.1109/IRPS.2019.8720559},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/NairBTZCGKC19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2019,
  title     = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8712125/proceeding},
  isbn      = {978-1-5386-9504-3},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/irps/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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