BibTeX record conf/irps/HiblotLHP19

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@inproceedings{DBLP:conf/irps/HiblotLHP19,
  author       = {Gaspard Hiblot and
                  Yefan Liu and
                  Geert Hellings and
                  Geert Van der Plas},
  title        = {Comparative Analysis of the Degradation Mechanisms in Logic and {I/O}
                  FinFET Devices Induced by Plasma Damage},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720525},
  doi          = {10.1109/IRPS.2019.8720525},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HiblotLHP19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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