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BibTeX record conf/irps/ChekuriSDM19
@inproceedings{DBLP:conf/irps/ChekuriSDM19, author = {Venkata Chaitanya Krishna Chekuri and Arvind Singh and Nihar Dasari and Saibal Mukhopadhyay}, title = {On the Effect of {NBTI} Induced Aging of Power Stage on the Transient Performance of On-Chip Voltage Regulators}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey, CA, USA, March 31 - April 4, 2019}, pages = {1--5}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/IRPS.2019.8720451}, doi = {10.1109/IRPS.2019.8720451}, timestamp = {Mon, 15 Jun 2020 17:10:58 +0200}, biburl = {https://dblp.org/rec/conf/irps/ChekuriSDM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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