BibTeX record conf/irps/BuryCKCFSWL18

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@inproceedings{DBLP:conf/irps/BuryCKCFSWL18,
  author       = {Erik Bury and
                  Adrian Vaisman Chasin and
                  Ben Kaczer and
                  Kai{-}Hsin Chuang and
                  Jacopo Franco and
                  Marko Simicic and
                  Pieter Weckx and
                  Dimitri Linten},
  title        = {Self-heating-aware {CMOS} reliability characterization using degradation
                  maps},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353541},
  doi          = {10.1109/IRPS.2018.8353541},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BuryCKCFSWL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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