BibTeX record conf/irps/BeekMRDSMKMG15

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@inproceedings{DBLP:conf/irps/BeekMRDSMKMG15,
  author       = {Simon Van Beek and
                  Koen Martens and
                  Philippe Roussel and
                  Gabriele Luca Donadio and
                  Johan Swerts and
                  Sofie Mertens and
                  Gouri Sankar Kar and
                  Tai Min and
                  Guido Groeseneken},
  title        = {Four point probe ramped voltage stress as an efficient method to understand
                  breakdown of {STT-MRAM} MgO tunnel junctions},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112818},
  doi          = {10.1109/IRPS.2015.7112818},
  timestamp    = {Fri, 01 Oct 2021 08:58:35 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BeekMRDSMKMG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}