BibTeX record conf/iolts/KarpodinisKN04

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@inproceedings{DBLP:conf/iolts/KarpodinisKN04,
  author       = {P. Karpodinis and
                  Dimitri Kagaris and
                  Dimitris Nikolos},
  title        = {Accumulator based Test-per-Scan {BIST}},
  booktitle    = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
                  12-14 July 2004, Funchal, Madeira Island, Portugal},
  pages        = {193--198},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.12},
  doi          = {10.1109/IOLTS.2004.12},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/KarpodinisKN04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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