BibTeX record conf/iolts/0001JTPS17

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@inproceedings{DBLP:conf/iolts/0001JTPS17,
  author       = {Binod Kumar and
                  Ankit Jindal and
                  Jaynarayan T. Tudu and
                  Brajesh Pandey and
                  Virendra Singh},
  title        = {Revisiting random access scan for effective enhancement of post-silicon
                  observability},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {132--137},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046208},
  doi          = {10.1109/IOLTS.2017.8046208},
  timestamp    = {Sun, 25 Oct 2020 22:46:52 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/0001JTPS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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