BibTeX record conf/ijcnn/GrayBDSC10

download as .bib file

@inproceedings{DBLP:conf/ijcnn/GrayBDSC10,
  author       = {David Gray and
                  David Bowes and
                  Neil Davey and
                  Yi Sun and
                  Bruce Christianson},
  title        = {Software defect prediction using static code metrics underestimates
                  defect-proneness},
  booktitle    = {International Joint Conference on Neural Networks, {IJCNN} 2010, Barcelona,
                  Spain, 18-23 July, 2010},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/IJCNN.2010.5596650},
  doi          = {10.1109/IJCNN.2010.5596650},
  timestamp    = {Thu, 14 Oct 2021 10:15:26 +0200},
  biburl       = {https://dblp.org/rec/conf/ijcnn/GrayBDSC10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.