BibTeX record conf/ieaaie/ChangWL06

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@inproceedings{DBLP:conf/ieaaie/ChangWL06,
  author       = {Chuan{-}Yu Chang and
                  Hung{-}Jen Wang and
                  Si{-}Yan Lin},
  editor       = {Moonis Ali and
                  Richard Dapoigny},
  title        = {Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic
                  Wafer Defect Inspection},
  booktitle    = {Advances in Applied Artificial Intelligence, 19th International Conference
                  on Industrial, Engineering and Other Applications of Applied Intelligent
                  Systems, {IEA/AIE} 2006, Annecy, France, June 27-30, 2006, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {4031},
  pages        = {1119--1126},
  publisher    = {Springer},
  year         = {2006},
  url          = {https://doi.org/10.1007/11779568\_119},
  doi          = {10.1007/11779568\_119},
  timestamp    = {Tue, 14 May 2019 10:00:37 +0200},
  biburl       = {https://dblp.org/rec/conf/ieaaie/ChangWL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}