BibTeX record conf/icst/AhmedJGM17

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@inproceedings{DBLP:conf/icst/AhmedJGM17,
  author    = {Iftekhar Ahmed and
               Carlos Jensen and
               Alex Groce and
               Paul E. McKenney},
  title     = {Applying Mutation Analysis on Kernel Test Suites: An Experience Report},
  booktitle = {2017 {IEEE} International Conference on Software Testing, Verification
               and Validation Workshops, {ICST} Workshops 2017, Tokyo, Japan, March
               13-17, 2017},
  pages     = {110--115},
  year      = {2017},
  crossref  = {DBLP:conf/icst/2017w},
  url       = {https://doi.org/10.1109/ICSTW.2017.26},
  doi       = {10.1109/ICSTW.2017.26},
  timestamp = {Sun, 09 Sep 2018 10:55:39 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/icst/AhmedJGM17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/icst/2017w,
  title     = {2017 {IEEE} International Conference on Software Testing, Verification
               and Validation Workshops, {ICST} Workshops 2017, Tokyo, Japan, March
               13-17, 2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7898633},
  isbn      = {978-1-5090-6676-6},
  timestamp = {Tue, 25 Apr 2017 12:34:44 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/icst/2017w},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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