BibTeX record conf/icip/RavindranFPN07

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@inproceedings{DBLP:conf/icip/RavindranFPN07,
  author    = {P. Ravindran and
               Nicola J. Ferrier and
               S. M. Park and
               P. F. Nealey},
  title     = {Image Based Metrology for Quantitative Analysis of Local Structural
               Similarity of Nanostructures},
  booktitle = {Proceedings of the International Conference on Image Processing, {ICIP}
               2007, September 16-19, 2007, San Antonio, Texas, {USA}},
  pages     = {329--332},
  year      = {2007},
  crossref  = {DBLP:conf/icip/2007},
  url       = {https://doi.org/10.1109/ICIP.2007.4380021},
  doi       = {10.1109/ICIP.2007.4380021},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/icip/RavindranFPN07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/icip/2007,
  title     = {Proceedings of the International Conference on Image Processing, {ICIP}
               2007, September 16-19, 2007, San Antonio, Texas, {USA}},
  publisher = {{IEEE}},
  year      = {2007},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4378863/proceeding},
  isbn      = {978-1-4244-1436-9},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/icip/2007},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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