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BibTeX record conf/icig/HuQZX17
@inproceedings{DBLP:conf/icig/HuQZX17, author = {Wei Hu and Hongyu Qi and Zhenbing Zhao and Leilei Xu}, editor = {Yao Zhao and Xiangwei Kong and David Taubman}, title = {A Method for Detecting Surface Defects in Insulators Based on {RPCA}}, booktitle = {Image and Graphics - 9th International Conference, {ICIG} 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part {II}}, series = {Lecture Notes in Computer Science}, volume = {10667}, pages = {163--173}, publisher = {Springer}, year = {2017}, url = {https://doi.org/10.1007/978-3-319-71589-6\_15}, doi = {10.1007/978-3-319-71589-6\_15}, timestamp = {Tue, 14 May 2019 10:00:40 +0200}, biburl = {https://dblp.org/rec/conf/icig/HuQZX17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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