BibTeX record conf/icecsys/SunJRSNDMB19

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@inproceedings{DBLP:conf/icecsys/SunJRSNDMB19,
  author    = {Yi Sun and
               Hui Jiang and
               Lakshmi Ramakrishnan and
               Matan Segal and
               Kundan Nepal and
               Jennifer Dworak and
               Theodore W. Manikas and
               R. Iris Bahar},
  title     = {Test Architecture for Fine Grained Capture Power Reduction},
  booktitle = {26th {IEEE} International Conference on Electronics, Circuits and
               Systems, {ICECS} 2019, Genoa, Italy, November 27-29, 2019},
  pages     = {558--561},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/ICECS46596.2019.8964790},
  doi       = {10.1109/ICECS46596.2019.8964790},
  timestamp = {Mon, 03 Feb 2020 13:51:51 +0100},
  biburl    = {https://dblp.org/rec/conf/icecsys/SunJRSNDMB19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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