BibTeX record conf/iccad/ShiYZHSH19

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@inproceedings{DBLP:conf/iccad/ShiYZHSH19,
  author       = {Xiao Shi and
                  Hao Yan and
                  Jiajia Zhang and
                  Qiancun Huang and
                  Longxing Shi and
                  Lei He},
  editor       = {David Z. Pan},
  title        = {Efficient Yield Analysis for {SRAM} and Analog Circuits using Meta-Model
                  based Importance Sampling Method},
  booktitle    = {Proceedings of the International Conference on Computer-Aided Design,
                  {ICCAD} 2019, Westminster, CO, USA, November 4-7, 2019},
  pages        = {1--8},
  publisher    = {{ACM}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ICCAD45719.2019.8942069},
  doi          = {10.1109/ICCAD45719.2019.8942069},
  timestamp    = {Thu, 11 Jan 2024 12:54:14 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/ShiYZHSH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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