BibTeX record conf/glvlsi/LaoudiasN04

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@inproceedings{DBLP:conf/glvlsi/LaoudiasN04,
  author    = {C. Laoudias and
               Dimitris Nikolos},
  title     = {A new test pattern generator for high defect coverage in a {BIST}
               environment},
  booktitle = {Proceedings of the 14th {ACM} Great Lakes Symposium on {VLSI} 2004,
               Boston, MA, USA, April 26-28, 2004},
  pages     = {417--420},
  year      = {2004},
  crossref  = {DBLP:conf/glvlsi/2004},
  url       = {https://doi.org/10.1145/988952.989052},
  doi       = {10.1145/988952.989052},
  timestamp = {Tue, 06 Nov 2018 16:59:34 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/glvlsi/LaoudiasN04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/glvlsi/2004,
  editor    = {David Garrett and
               John Lach and
               Charles A. Zukowski},
  title     = {Proceedings of the 14th {ACM} Great Lakes Symposium on {VLSI} 2004,
               Boston, MA, USA, April 26-28, 2004},
  publisher = {{ACM}},
  year      = {2004},
  url       = {https://doi.org/10.1145/988952},
  doi       = {10.1145/988952},
  isbn      = {1-58113-853-9},
  timestamp = {Wed, 24 May 2017 08:28:02 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/glvlsi/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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