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BibTeX record conf/ftcs/NachmanSUR96
@inproceedings{DBLP:conf/ftcs/NachmanSUR96, author = {Lama Nachman and Kewal K. Saluja and Shambhu J. Upadhyaya and Robert Reuse}, title = {Random Pattern Testing for Sequential Circuits Revisited}, booktitle = {Digest of Papers: FTCS-26, The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing, Sendai, Japan, June 25-27, 1996}, pages = {44--52}, publisher = {{IEEE} Computer Society}, year = {1996}, url = {https://doi.org/10.1109/FTCS.1996.534593}, doi = {10.1109/FTCS.1996.534593}, timestamp = {Fri, 24 Mar 2023 00:03:46 +0100}, biburl = {https://dblp.org/rec/conf/ftcs/NachmanSUR96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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