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BibTeX record conf/fdtc/MadauABGHMRS0V18
@inproceedings{DBLP:conf/fdtc/MadauABGHMRS0V18, author = {Maxime Madau and Michel Agoyan and Josep Balasch and Milos Grujic and Patrick Haddad and Philippe Maurine and Vladimir Rozic and Dave Singel{\'{e}}e and Bohan Yang and Ingrid Verbauwhede}, title = {The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators}, booktitle = {2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC} 2018, Amsterdam, The Netherlands, September 13, 2018}, pages = {43--48}, publisher = {{IEEE} Computer Society}, year = {2018}, url = {https://doi.org/10.1109/FDTC.2018.00015}, doi = {10.1109/FDTC.2018.00015}, timestamp = {Fri, 24 Mar 2023 00:03:02 +0100}, biburl = {https://dblp.org/rec/conf/fdtc/MadauABGHMRS0V18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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