BibTeX record conf/ets/SauerCBP12

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@inproceedings{DBLP:conf/ets/SauerCBP12,
  author    = {Matthias Sauer and
               Alexander Czutro and
               Bernd Becker and
               Ilia Polian},
  title     = {On the quality of test vectors for post-silicon characterization},
  booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
               28 - June 1 2012},
  pages     = {1--6},
  year      = {2012},
  crossref  = {DBLP:conf/ets/2012},
  url       = {https://doi.org/10.1109/ETS.2012.6233027},
  doi       = {10.1109/ETS.2012.6233027},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/SauerCBP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2012,
  title     = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
               28 - June 1 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6222773/proceeding},
  isbn      = {978-1-4673-0697-3},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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