BibTeX record conf/ets/KraakTHWCCSWK18

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@inproceedings{DBLP:conf/ets/KraakTHWCCSWK18,
  author    = {Daniel Kraak and
               Mottaqiallah Taouil and
               Said Hamdioui and
               Pieter Weckx and
               Francky Catthoor and
               Abhijit Chatterjee and
               Adit D. Singh and
               Hans{-}Joachim Wunderlich and
               Naghmeh Karimi},
  title     = {Device aging: {A} reliability and security concern},
  booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
               May 28 - June 1, 2018},
  pages     = {1--10},
  year      = {2018},
  crossref  = {DBLP:conf/ets/2018},
  url       = {https://doi.org/10.1109/ETS.2018.8400702},
  doi       = {10.1109/ETS.2018.8400702},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/KraakTHWCCSWK18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2018,
  title     = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
               May 28 - June 1, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8392663/proceeding},
  isbn      = {978-1-5386-3728-9},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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