BibTeX record conf/ets/JaniLVDTB19

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@inproceedings{DBLP:conf/ets/JaniLVDTB19,
  author       = {Imed Jani and
                  Didier Lattard and
                  Pascal Vivet and
                  Jean Durupt and
                  S{\'{e}}bastien Thuries and
                  Edith Beign{\'{e}}},
  title        = {Test Solutions for High Density 3D-IC Interconnects - Focus on SRAM-on-Logic
                  Partitioning},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791531},
  doi          = {10.1109/ETS.2019.8791531},
  timestamp    = {Tue, 07 May 2024 20:06:33 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/JaniLVDTB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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