BibTeX record conf/ets/InoueTYIF10

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@inproceedings{DBLP:conf/ets/InoueTYIF10,
  author       = {Michiko Inoue and
                  Akira Taketani and
                  Tomokazu Yoneda and
                  Hiroshi Iwata and
                  Hideo Fujiwara},
  title        = {Test pattern selection to optimize delay test quality with a limited
                  size of test set},
  booktitle    = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
                  May 24-28, 2010},
  pages        = {260},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/ETSYM.2010.5512733},
  doi          = {10.1109/ETSYM.2010.5512733},
  timestamp    = {Tue, 28 Apr 2020 11:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/InoueTYIF10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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