BibTeX record conf/ets/FirouziYVKCT15

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@inproceedings{DBLP:conf/ets/FirouziYVKCT15,
  author    = {Farshad Firouzi and
               Fangming Ye and
               Arunkumar Vijayan and
               Abhishek Koneru and
               Krishnendu Chakrabarty and
               Mehdi Baradaran Tahoori},
  title     = {Re-using {BIST} for circuit aging monitoring},
  booktitle = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania,
               25-29 May, 2015},
  pages     = {1--2},
  year      = {2015},
  crossref  = {DBLP:conf/ets/2015},
  url       = {https://doi.org/10.1109/ETS.2015.7138768},
  doi       = {10.1109/ETS.2015.7138768},
  timestamp = {Mon, 22 May 2017 17:11:05 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/FirouziYVKCT15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2015,
  title     = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania,
               25-29 May, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7127855},
  isbn      = {978-1-4799-7603-4},
  timestamp = {Mon, 13 Jul 2015 16:39:42 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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