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BibTeX record conf/esem/YanFLXZ17
@inproceedings{DBLP:conf/esem/YanFLXZ17, author = {Meng Yan and Yicheng Fang and David Lo and Xin Xia and Xiaohong Zhang}, editor = {Ayse Bener and Burak Turhan and Stefan Biffl}, title = {File-Level Defect Prediction: Unsupervised vs. Supervised Models}, booktitle = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10, 2017}, pages = {344--353}, publisher = {{IEEE} Computer Society}, year = {2017}, url = {https://doi.org/10.1109/ESEM.2017.48}, doi = {10.1109/ESEM.2017.48}, timestamp = {Sat, 30 Sep 2023 09:40:24 +0200}, biburl = {https://dblp.org/rec/conf/esem/YanFLXZ17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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