BibTeX record conf/esem/MockusND09

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@inproceedings{DBLP:conf/esem/MockusND09,
  author       = {Audris Mockus and
                  Nachiappan Nagappan and
                  Trung T. Dinh{-}Trong},
  title        = {Test coverage and post-verification defects: {A} multiple case study},
  booktitle    = {Proceedings of the Third International Symposium on Empirical Software
                  Engineering and Measurement, {ESEM} 2009, October 15-16, 2009, Lake
                  Buena Vista, Florida, {USA}},
  pages        = {291--301},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ESEM.2009.5315981},
  doi          = {10.1109/ESEM.2009.5315981},
  timestamp    = {Fri, 24 Mar 2023 00:05:00 +0100},
  biburl       = {https://dblp.org/rec/conf/esem/MockusND09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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