BibTeX record conf/ease/Petric16

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@inproceedings{DBLP:conf/ease/Petric16,
  author       = {Jean Petric},
  editor       = {Sarah Beecham and
                  Barbara A. Kitchenham and
                  Stephen G. MacDonell},
  title        = {Using different characteristics of machine learners to identify different
                  defect families},
  booktitle    = {Proceedings of the 20th International Conference on Evaluation and
                  Assessment in Software Engineering, {EASE} 2016, Limerick, Ireland,
                  June 01 - 03, 2016},
  pages        = {5:1--5:4},
  publisher    = {{ACM}},
  year         = {2016},
  url          = {https://doi.org/10.1145/2915970.2915979},
  doi          = {10.1145/2915970.2915979},
  timestamp    = {Mon, 16 Sep 2019 15:31:54 +0200},
  biburl       = {https://dblp.org/rec/conf/ease/Petric16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}