BibTeX record conf/dft/PaliaroutisTEDS18

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@inproceedings{DBLP:conf/dft/PaliaroutisTEDS18,
  author       = {Georgios Ioannis Paliaroutis and
                  Pelopidas Tsoumanis and
                  Nestor E. Evmorfopoulos and
                  George Dimitriou and
                  Georgios I. Stamoulis},
  title        = {A Placement-Aware Soft Error Rate Estimation of Combinational Circuits
                  for Multiple Transient Faults in {CMOS} Technology},
  booktitle    = {2018 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2018, Chicago, IL, USA,
                  October 8-10, 2018},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/DFT.2018.8602855},
  doi          = {10.1109/DFT.2018.8602855},
  timestamp    = {Fri, 24 Mar 2023 00:02:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/PaliaroutisTEDS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}