BibTeX record conf/dft/LiHHTHLMHBWTW10

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@inproceedings{DBLP:conf/dft/LiHHTHLMHBWTW10,
  author       = {Tsung{-}Yeh Li and
                  Shi{-}Yu Huang and
                  Hsuan{-}Jung Hsu and
                  Chao{-}Wen Tzeng and
                  Chih{-}Tsun Huang and
                  Jing{-}Jia Liou and
                  Hsi{-}Pin Ma and
                  Po{-}Chiun Huang and
                  Jenn{-}Chyou Bor and
                  Cheng{-}Wen Wu and
                  Ching{-}Cheng Tien and
                  Mike Wang},
  title        = {AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay
                  Defects},
  booktitle    = {25th {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} Systems, {DFT} 2010, Kyoto, Japan, October 6-8, 2010},
  pages        = {340--348},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/DFT.2010.48},
  doi          = {10.1109/DFT.2010.48},
  timestamp    = {Sat, 30 Sep 2023 09:38:54 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/LiHHTHLMHBWTW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}