BibTeX record conf/dft/HamamuraNKIOKS02

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@inproceedings{DBLP:conf/dft/HamamuraNKIOKS02,
  author       = {Yuichi Hamamura and
                  Kazunori Nemoto and
                  Takaaki Kumazawa and
                  Hisafumi Iwata and
                  Kousuke Okuyama and
                  Shiro Kamohara and
                  Aritoshi Sugimoto},
  title        = {Repair Yield Simulation with Iterative Critical Area Analysis for
                  Different Types of Failure},
  booktitle    = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
                  Canada, Proceedings},
  pages        = {305--313},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/DFTVS.2002.1173527},
  doi          = {10.1109/DFTVS.2002.1173527},
  timestamp    = {Fri, 24 Mar 2023 00:02:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/HamamuraNKIOKS02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}