BibTeX record conf/dft/GaoYZHR18

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@inproceedings{DBLP:conf/dft/GaoYZHR18,
  author       = {Zhen Gao and
                  Lina Yan and
                  Jinhua Zhu and
                  Ruishi Han and
                  Pedro Reviriego},
  title        = {Analysis of the Effects of Single Event Upsets (SEUs) on User Memory
                  in {FPGA} Implemented Viterbi Decoders},
  booktitle    = {2018 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2018, Chicago, IL, USA,
                  October 8-10, 2018},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/DFT.2018.8602988},
  doi          = {10.1109/DFT.2018.8602988},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GaoYZHR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}