BibTeX record conf/dft/ChiluvuriKB94

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@inproceedings{DBLP:conf/dft/ChiluvuriKB94,
  author       = {Venkat K. R. Chiluvuri and
                  Israel Koren and
                  Jeffrey L. Burns},
  title        = {The Effect of Wire Length Minimization on Yield},
  booktitle    = {The {IEEE} International Workshop on Defect and Fault Tolerance in
                  {VLSI} Systems, October 17-19, 1994, Montr{\'{e}}al, Quebec,
                  Canada, Proceedings},
  pages        = {97--105},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  timestamp    = {Mon, 03 Feb 2003 15:42:59 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChiluvuriKB94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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