BibTeX record conf/dft/BarbagalloBMBFFS96

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@inproceedings{DBLP:conf/dft/BarbagalloBMBFFS96,
  author       = {Stefano Barbagallo and
                  Monica Lobetti Bodoni and
                  Davide Medina and
                  Gabriel de Blasio and
                  M. Ferloni and
                  Franco Fummi and
                  Donatella Sciuto},
  title        = {A Parametric Design of a Built-in Self-Test {FIFO} Embedded Memory},
  booktitle    = {1996 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 1996, Boston, MA, USA,
                  November 6-8, 1996},
  pages        = {221--230},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/DFTVS.1996.572028},
  doi          = {10.1109/DFTVS.1996.572028},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BarbagalloBMBFFS96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}