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BibTeX record conf/ddecs/Jonca07
@inproceedings{DBLP:conf/ddecs/Jonca07, author = {Wlodzimierz Jonca}, editor = {Patrick Girard and Andrzej Krasniewski and Elena Gramatov{\'{a}} and Adam Pawlak and Tomasz Garbolino}, title = {Open Defects Caused by Scratches and Yield Modelling in Deep Sub-micron Integrated Circuit}, booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w, Poland, April 11-13, 2007}, pages = {365--368}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DDECS.2007.4295314}, doi = {10.1109/DDECS.2007.4295314}, timestamp = {Fri, 24 Mar 2023 00:04:14 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/Jonca07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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