BibTeX record conf/date/KraakATHWCC18

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@inproceedings{DBLP:conf/date/KraakATHWCC18,
  author    = {Daniel Kraak and
               Innocent Agbo and
               Mottaqiallah Taouil and
               Said Hamdioui and
               Pieter Weckx and
               Stefan Cosemans and
               Francky Catthoor},
  title     = {Degradation analysis of high performance 14nm FinFET {SRAM}},
  booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages     = {201--206},
  year      = {2018},
  crossref  = {DBLP:conf/date/2018},
  url       = {https://doi.org/10.23919/DATE.2018.8342003},
  doi       = {10.23919/DATE.2018.8342003},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/KraakATHWCC18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2018,
  editor    = {Jan Madsen and
               Ayse K. Coskun},
  title     = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8337149/proceeding},
  isbn      = {978-3-9819263-0-9},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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