BibTeX record conf/dac/OgiharaSM85

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@inproceedings{DBLP:conf/dac/OgiharaSM85,
  author       = {Takuji Ogihara and
                  Shuichi Saruyama and
                  Shinichi Murai},
  editor       = {Hillel Ofek and
                  Lawrence A. O'Neill},
  title        = {{PATEGE:} an automatic {DC} parametric test generation system for
                  series gated {ECL} circuits},
  booktitle    = {Proceedings of the 22nd {ACM/IEEE} conference on Design automation,
                  {DAC} 1985, Las Vegas, Nevada, USA, 1985},
  pages        = {212--218},
  publisher    = {{ACM}},
  year         = {1985},
  url          = {https://doi.org/10.1145/317825.317859},
  doi          = {10.1145/317825.317859},
  timestamp    = {Tue, 06 Nov 2018 16:58:18 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/OgiharaSM85.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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