BibTeX record conf/dac/LiouWCDMKW02

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@inproceedings{DBLP:conf/dac/LiouWCDMKW02,
  author       = {Jing{-}Jia Liou and
                  Li{-}C. Wang and
                  Kwang{-}Ting Cheng and
                  Jennifer Dworak and
                  M. Ray Mercer and
                  Rohit Kapur and
                  Thomas W. Williams},
  title        = {Enhancing test efficiency for delay fault testing using multiple-clocked
                  schemes},
  booktitle    = {Proceedings of the 39th Design Automation Conference, {DAC} 2002,
                  New Orleans, LA, USA, June 10-14, 2002},
  pages        = {371--374},
  publisher    = {{ACM}},
  year         = {2002},
  url          = {https://doi.org/10.1145/513918.514013},
  doi          = {10.1145/513918.514013},
  timestamp    = {Tue, 06 Nov 2018 16:58:16 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/LiouWCDMKW02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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