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BibTeX record conf/dac/LiouWCDMKW02
@inproceedings{DBLP:conf/dac/LiouWCDMKW02, author = {Jing{-}Jia Liou and Li{-}C. Wang and Kwang{-}Ting Cheng and Jennifer Dworak and M. Ray Mercer and Rohit Kapur and Thomas W. Williams}, title = {Enhancing test efficiency for delay fault testing using multiple-clocked schemes}, booktitle = {Proceedings of the 39th Design Automation Conference, {DAC} 2002, New Orleans, LA, USA, June 10-14, 2002}, pages = {371--374}, publisher = {{ACM}}, year = {2002}, url = {https://doi.org/10.1145/513918.514013}, doi = {10.1145/513918.514013}, timestamp = {Tue, 06 Nov 2018 16:58:16 +0100}, biburl = {https://dblp.org/rec/conf/dac/LiouWCDMKW02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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