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BibTeX record conf/dac/HuangC17
@inproceedings{DBLP:conf/dac/HuangC17, author = {Yu{-}Chen Huang and Yao{-}Wen Chang}, title = {Fogging Effect Aware Placement in Electron Beam Lithography}, booktitle = {Proceedings of the 54th Annual Design Automation Conference, {DAC} 2017, Austin, TX, USA, June 18-22, 2017}, pages = {53:1--53:6}, publisher = {{ACM}}, year = {2017}, url = {https://doi.org/10.1145/3061639.3062252}, doi = {10.1145/3061639.3062252}, timestamp = {Tue, 06 Nov 2018 16:58:17 +0100}, biburl = {https://dblp.org/rec/conf/dac/HuangC17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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