BibTeX record conf/dac/BossenOPS71

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@inproceedings{DBLP:conf/dac/BossenOPS71,
  author       = {Douglas C. Bossen and
                  Daniel L. Ostapko and
                  Arvind M. Patel and
                  Martin S. Schmookler},
  title        = {Minimum test patterns for residue networks},
  booktitle    = {Proceedings of the 8th Design Automation Workshop, {DAC} '71, Atlantic
                  City, NJ, USA, June 28-30, 1971},
  pages        = {278--284},
  publisher    = {{ACM}},
  year         = {1971},
  url          = {https://doi.org/10.1145/800158.805083},
  doi          = {10.1145/800158.805083},
  timestamp    = {Tue, 06 Nov 2018 16:58:18 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/BossenOPS71.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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