BibTeX record conf/dac/BhattacharyaAA92

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@inproceedings{DBLP:conf/dac/BhattacharyaAA92,
  author       = {Debashis Bhattacharya and
                  Prathima Agrawal and
                  Vishwani D. Agrawal},
  editor       = {Daniel G. Schweikert},
  title        = {Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions},
  booktitle    = {Proceedings of the 29th Design Automation Conference, Anaheim, California,
                  USA, June 8-12, 1992},
  pages        = {159--164},
  publisher    = {{IEEE} Computer Society Press},
  year         = {1992},
  url          = {http://portal.acm.org/citation.cfm?id=113938.119386},
  timestamp    = {Thu, 16 Mar 2017 13:48:23 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/BhattacharyaAA92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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