BibTeX record conf/csreaESA/HanL04

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@inproceedings{DBLP:conf/csreaESA/HanL04,
  author    = {Yinhe Han and
               Xiaowei Li},
  title     = {Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based
               Test},
  booktitle = {Proceedings of the International Conference on Embedded Systems and
               Applications, {ESA} '04 {\&} Proceedings of the International
               Conference on VLSI, {VLSI} '04, June 21-24, 2004, Las Vegas, Nevada,
               {USA}},
  pages     = {374--381},
  year      = {2004},
  crossref  = {DBLP:conf/csreaESA/2004},
  timestamp = {Thu, 06 Dec 2012 07:39:40 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/csreaESA/HanL04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/csreaESA/2004,
  editor    = {Hamid R. Arabnia and
               Minyi Guo and
               Laurence Tianruo Yang},
  title     = {Proceedings of the International Conference on Embedded Systems and
               Applications, {ESA} '04 {\&} Proceedings of the International
               Conference on VLSI, {VLSI} '04, June 21-24, 2004, Las Vegas, Nevada,
               {USA}},
  publisher = {{CSREA} Press},
  year      = {2004},
  isbn      = {1-932415-41-6},
  timestamp = {Fri, 04 Mar 2005 11:26:21 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/csreaESA/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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