BibTeX record conf/cicc/NomuraMITOFONMHKYT13

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@inproceedings{DBLP:conf/cicc/NomuraMITOFONMHKYT13,
  author    = {Takao Nomura and
               Ryo Mori and
               Munehiro Ito and
               Koji Takayanagi and
               Toshihiko Ochiai and
               Kazuki Fukuoka and
               Kazuo Otsuga and
               Koji Nii and
               Sadayuki Morita and
               Tomoaki Hashimoto and
               Tsuyoshi Kida and
               Junichi Yamada and
               Hideki Tanaka},
  title     = {Testability improvement for 12.8 GB/s Wide {IO} {DRAM} controller
               by small area pre-bonding {TSV} tests and a 1 GHz sampled fully digital
               noise monitor},
  booktitle = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
               {CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2013},
  url       = {https://doi.org/10.1109/CICC.2013.6658415},
  doi       = {10.1109/CICC.2013.6658415},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/cicc/NomuraMITOFONMHKYT13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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