BibTeX record conf/cicc/KimSKDCKSBM13

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@inproceedings{DBLP:conf/cicc/KimSKDCKSBM13,
  author    = {Young Moon Kim and
               Jun Seomun and
               Hyung{-}Ock Kim and
               Kyung Tae Do and
               Jung Yun Choi and
               Kee Sup Kim and
               Matthias Sauer and
               Bernd Becker and
               Subhasish Mitra},
  title     = {Detection of early-life failures in high-K metal-gate transistors
               and ultra low-K inter-metal dielectrics},
  booktitle = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
               {CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
  pages     = {1--4},
  year      = {2013},
  crossref  = {DBLP:conf/cicc/2013},
  url       = {https://doi.org/10.1109/CICC.2013.6658544},
  doi       = {10.1109/CICC.2013.6658544},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cicc/KimSKDCKSBM13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/cicc/2013,
  title     = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
               {CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
  publisher = {{IEEE}},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6648471/proceeding},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cicc/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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