BibTeX record conf/case/ChenWWWC17

download as .bib file

@inproceedings{DBLP:conf/case/ChenWWWC17,
  author       = {Ying{-}Jen Chen and
                  Bocheng Wang and
                  Jei{-}Zheng Wu and
                  Yi{-}Chia Wu and
                  Chen{-}Fu Chien},
  title        = {Big data analytic for multivariate fault detection and classification
                  in semiconductor manufacturing},
  booktitle    = {13th {IEEE} Conference on Automation Science and Engineering, {CASE}
                  2017, Xi'an, China, August 20-23, 2017},
  pages        = {731--736},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/COASE.2017.8256190},
  doi          = {10.1109/COASE.2017.8256190},
  timestamp    = {Tue, 22 Sep 2020 16:27:21 +0200},
  biburl       = {https://dblp.org/rec/conf/case/ChenWWWC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics