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BibTeX record conf/case/ChenWWWC17
@inproceedings{DBLP:conf/case/ChenWWWC17, author = {Ying{-}Jen Chen and Bocheng Wang and Jei{-}Zheng Wu and Yi{-}Chia Wu and Chen{-}Fu Chien}, title = {Big data analytic for multivariate fault detection and classification in semiconductor manufacturing}, booktitle = {13th {IEEE} Conference on Automation Science and Engineering, {CASE} 2017, Xi'an, China, August 20-23, 2017}, pages = {731--736}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/COASE.2017.8256190}, doi = {10.1109/COASE.2017.8256190}, timestamp = {Tue, 22 Sep 2020 16:27:21 +0200}, biburl = {https://dblp.org/rec/conf/case/ChenWWWC17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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