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BibTeX record conf/ats/XiangCSF03
@inproceedings{DBLP:conf/ats/XiangCSF03, author = {Dong Xiang and Ming{-}Jing Chen and Jia{-}Guang Sun and Hideo Fujiwara}, title = {Improving Test Quality of Scan-Based {BIST} by Scan Chain Partitioning}, booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian, China}, pages = {12--17}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ATS.2003.1250774}, doi = {10.1109/ATS.2003.1250774}, timestamp = {Fri, 24 Mar 2023 00:02:33 +0100}, biburl = {https://dblp.org/rec/conf/ats/XiangCSF03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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