BibTeX record conf/ats/Seo0LLYKK15

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@inproceedings{DBLP:conf/ats/Seo0LLYKK15,
  author       = {Sungyoul Seo and
                  Yong Lee and
                  Hyeonchan Lim and
                  Joohwan Lee and
                  Hongbom Yoo and
                  Yojoung Kim and
                  Sungho Kang},
  title        = {Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift
                  Power Reduction},
  booktitle    = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
                  22-25, 2015},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/ATS.2015.8},
  doi          = {10.1109/ATS.2015.8},
  timestamp    = {Wed, 28 Feb 2024 10:42:49 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Seo0LLYKK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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